Energy-level alignment at model interfaces of organic electroluminescent devices studied by UV photoemission: trend in the deviation from the traditional way of estimating the interfacial electronic structures
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Selected Topics in Quantum Electronics
- Vol. 4 (1), 24-33
- https://doi.org/10.1109/2944.669459
Abstract
The electronic structures of model interfaces of organic electroluminescent (EL) devices were investigated with UV photoemission spectroscopy (UPS). Interfaces of TTN (tetrathianaphthacene) and TCNQ (tetracyanoquinodimethane) were also studied as extreme cases for hole transport and electron transport material, respectively. For all organic/metal interfaces studied, the work function of metal electrode was changed by deposition of organic layer, i.e., the vacuum level was shifted at the interface, indicating the invalidity of the traditional energy level alignment model where a common vacuum level was assumed at organic/metal interface. At TCNQ/Au, DP-NTCI/Al, which are acceptor/metal interfaces, upward shift of the vacuum level of organic layer relative to that of metal was observed, suggesting the formation of interfacial dipole due to electron-transfer from metal to acceptor. At other organic/metal interfaces, TPD(N, N'-diphenyl-N, N'-(3-methylphenyl)-1, 1'-biphenyl-4, 4'-diamine)/Au or ITO (indium tin oxide), ALq/sub 3/ (tris(8-hydroxyquinolino) aluminum)/Al, DP-NTCl(N, N'-diphenyl-1,4,5,8- naphthyltetracarboxylimide)/Al or Au, downward shift of the vacuum level was observed. Such downward shift has been also observed in our previous study for porphyrin/metal interfaces, and seems to be a trend for organic/metal interfaces at which no electron-transfer from metal to organic layer occurs. This trend suggests that the traditional model tends to underestimate (overestimate) the barrier height for hole (electron) injection. On the other hand, the vacuum level shift at ALq/sub 3//TPD interface was less than 0.1 eV, leading to an apparent applicability of the traditional model. However, it is not always the case for organic/organic interfaces: finite shift of 0.2 eV was observed at TTN/TCNQ interface due to electron-transfer from TTN to TCNQ. Possible origins of vacuum level shift at organic/metal interfaces were also discussed.Keywords
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