A sequential feature extraction approach for naïve bayes classification of microarray data
- 31 August 2009
- journal article
- Published by Elsevier BV in Expert Systems with Applications
- Vol. 36 (6), 9919-9923
- https://doi.org/10.1016/j.eswa.2009.01.075
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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