Nondestructive, High-Resolution Materials Characterization with the Confocal Raman-AFM
- 1 May 2005
- journal article
- research article
- Published by Oxford University Press (OUP) in Microscopy Today
- Vol. 13 (3), 30-35
- https://doi.org/10.1017/s1551929500051610
Abstract
Materials research, biomedical research, and semiconductor manufacturing can all benefit from nondestructive, high-resolution methods of analysis. As most materials are heterogeneous, it is important to not only acquire high resolution topographic information, but also to identify the chemical composition of samples. A combination of high resolution microscopy with chemically sensitive spectroscopy combined in one instrument allows the detailed characterization of samples with different analytical techniques. When individual instruments are used, returning to a previously surveyed sample area can be very time consuming if not impossible without surface markers.Keywords
This publication has 1 reference indexed in Scilit:
- G. Sokrates: Infrared and Raman characteristic group frequencies: tables and chartsColloid and Polymer Science, 2004