Characterization of Highly Ordered MCM-41 Silicas Using X-ray Diffraction and Nitrogen Adsorption
- 15 June 1999
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 15 (16), 5279-5284
- https://doi.org/10.1021/la990179v
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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