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Two novel characteristics in palmprint verification: datum point invariance and line feature matching
Home
Publications
Two novel characteristics in palmprint verification: datum point invariance and line feature matching
Two novel characteristics in palmprint verification: datum point invariance and line feature matching
Dapeng Zhang
Dapeng Zhang
WS
Wei Shu
Wei Shu
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30 April 1999
journal article
Published by
Elsevier BV
in
Pattern Recognition
Vol. 32
(4)
,
691-702
https://doi.org/10.1016/s0031-3203(98)00117-4
Abstract
No abstract available
Cited by 284 articles