In situ probing electrical response on bending of ZnO nanowires inside transmission electron microscope
- 26 May 2008
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 92 (21), 213105
- https://doi.org/10.1063/1.2936080
Abstract
In situ electrical transport measurements on individual bent ZnO nanowires have been performed inside a high-resolution transmission electron microscope, where the crystal structures of ZnO nanowires were simultaneously imaged. A series of consecutively recorded current-voltage curves along with an increase in nanowire bending show the striking effect of bending on their electrical behavior. The bending-induced changes of resistivity, electron concentration, and carrier mobility of ZnO nanowires have been retrieved based on the experimental data, which suggests the applications of ZnO nanowires as nanoelectromechanical sensors.
Keywords
This publication has 21 references indexed in Scilit:
- Bending strength and flexibility of ZnO nanowiresApplied Physics Letters, 2007
- Determination of the natural frequency of a cantilevered ZnO nanowire resonantly excited by a sinusoidal electric fieldNanotechnology, 2007
- Piezoelectric Field Effect Transistor and Nanoforce Sensor Based on a Single ZnO NanowireNano Letters, 2006
- Quantifying the elastic deformation behavior of bridged nanobeltsApplied Physics Letters, 2006
- Piezoelectric Nanogenerators Based on Zinc Oxide Nanowire ArraysScience, 2006
- Size Dependence of Young’s Modulus in ZnO NanowiresPhysical Review Letters, 2006
- Elastic Property of Vertically Aligned NanowiresNano Letters, 2005
- Experimental measurement and model analysis of damping effect in nanoscale mechanical beam resonators in airJournal of Applied Physics, 2004
- Room-Temperature Ultraviolet Nanowire NanolasersScience, 2001
- Nanobelts of Semiconducting OxidesScience, 2001