Tracks of Charged Particles in High Polymers
- 14 June 1963
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 140 (3572), 1221-1222
- https://doi.org/10.1126/science.140.3572.1221
Abstract
Heavily ionizing particles create trails of damage as they move through materials. In both addition and condensation polymers these trails can be selectively dissolved so that the sites and the directions taken by the moving particles are revealed. These materials thus serve as simple detectors of heavily charged particles.Keywords
This publication has 6 references indexed in Scilit:
- Method of Forming Fine Holes of Near Atomic DimensionsReview of Scientific Instruments, 1963
- A new track detector for heavy particle studiesPhysics Letters, 1962
- Chemical Etching of Charged-Particle Tracks in SolidsJournal of Applied Physics, 1962
- Electron Microscope Observation of Etched Tracks from Spallation Recoils in MicaPhysical Review Letters, 1962
- Examination of fission fragment tracks with an electron microscopePhilosophical Magazine, 1959
- Etching of Radiation Damage in Lithium FluorideNature, 1958