A low-power true random number generator using random telegraph noise of single oxide-traps
- 1 January 2006
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1666-1675
- https://doi.org/10.1109/isscc.2006.1696222
Abstract
A true random number generator is realized by utilizing the noise produced by single oxide traps in small-area MOSFETs in combination with built-in redundancy. The circuit has an area of 0.009mm2 in 0.12mum CMOS and consumes 50muW at 200kb/s random output data. The concept is robust against environmental noise and supply-voltage variations and is thus suitable for operation within security controllersKeywords
This publication has 3 references indexed in Scilit:
- Physical random number generator based on MOS structure after soft breakdownIEEE Journal of Solid-State Circuits, 2004
- A high-speed oscillator-based truly random number source for cryptographic applications on a smartcard ICIEEE Transactions on Computers, 2003
- A noise-based IC random number generator for applications in cryptographyIEEE Transactions on Circuits and Systems I: Regular Papers, 2000