Development of AFM-based techniques to measure mechanical properties of nanoscale structures
- 1 October 2002
- journal article
- Published by Elsevier BV in Sensors and Actuators A: Physical
- Vol. 101 (3), 338-351
- https://doi.org/10.1016/s0924-4247(02)00268-6
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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