DC leakage and failure of PZT thin film capacitors for non-volatile ferroelectric memory and dram applications
- 1 September 1994
- journal article
- Published by Taylor & Francis Ltd in Integrated Ferroelectrics
- Vol. 5 (1), 59-72
- https://doi.org/10.1080/10584589408018680
Abstract
No abstract availableKeywords
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