Analysis of XPS spectra of Fe2+ and Fe3+ ions in oxide materials
Top Cited Papers
- 1 February 2008
- journal article
- Published by Elsevier BV in Applied Surface Science
- Vol. 254 (8), 2441-2449
- https://doi.org/10.1016/j.apsusc.2007.09.063
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Effect of curve fitting parameters on quantitative analysis of Fe0.94O and Fe2O3 using XPSJournal of Electron Spectroscopy and Related Phenomena, 2006
- Surface and interface properties of epitaxial iron oxide thin films deposited on MgO(001) studied by XPS and Raman spectroscopySurface and Interface Analysis, 2000
- The oxidation state of Fe(100) after initial oxidation in O2Surface Science, 1999
- Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide filmsSurface and Interface Analysis, 1998
- An XPS study of iron sodium silicate glass surfacesJournal of Non-Crystalline Solids, 1996
- Simultaneous determination of composition and thickness of thin iron-oxide films from XPS Fe 2p spectraApplied Surface Science, 1996
- Structure of α-Fe2O3 single crystal surfaces following Ar+ ion bombardment and annealing in O2Surface Science, 1988
- XPS analysis of iron aluminum oxide systemsApplied Surface Science, 1986
- A study of the core level electrons in iron and its three oxides by means of X-ray photoelectron spectroscopyJournal of Physics D: Applied Physics, 1983
- Photoemission studies of adsorbed oxygen and oxide layersSurface Science Reports, 1982