Evolution of surface morphology during Fe/Si(111) and Fe/Si(001) heteroepitaxy
Open Access
- 15 February 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (7), 4650-4653
- https://doi.org/10.1103/physrevb.59.4650
Abstract
The evolution of Fe surface morphology during heteroepitaxial growth on Si(111) and Si(001) substrates was investigated using real-time synchrotron x-ray reflectivity measurements. The growth on the Si(111) surface was divided into the initial stage heteroepitaxial regime, the intermediate stage crossover regime, and the final-stage homoepitaxial regime. The evolution of the surface roughness in the late stage growth was described by the dynamic scaling exponent of consistent with reported values. On the Si(001) surface, an interlayer was formed prior to the growth of a nonepitaxial Fe layer. The roughness evolution of the Fe/Si(001) was described by
Keywords
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