Electrical characterization of locally charged oxidized nanocrystalline diamond films by Kelvin force microscopy
- 4 September 2008
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 205 (9), 2136-2140
- https://doi.org/10.1002/pssa.200879712
Abstract
No abstract availableKeywords
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