Texture defect detection using the adaptive two-dimensional lattice filter
- 24 December 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A Structural Approach To Identify Defects In Textured ImagesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Texture inspection with self-adaptive convolution filtersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Texture measures for carpet wear assessmentIEEE Transactions on Pattern Analysis and Machine Intelligence, 1988
- Identifying and Locating Surface Defects in Wood: Part of an Automated Lumber Processing SystemIEEE Transactions on Pattern Analysis and Machine Intelligence, 1983