ATPG for heat dissipation minimization during test application
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 47 (2), 256-262
- https://doi.org/10.1109/12.663775
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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