Photoelectron yield spectroscopy of electronic states at ultrathin SiO2 Si
- 30 September 1999
- journal article
- Published by Elsevier BV in Microelectronic Engineering
- Vol. 48 (1-4), 63-66
- https://doi.org/10.1016/s0167-9317(99)00339-1
Abstract
No abstract availableKeywords
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