Defect structure of oxide ferroelectrics—valence state, site of incorporation, mechanisms of charge compensation and internal bias fields
- 24 April 2007
- journal article
- Published by Springer Science and Business Media LLC in Journal of Electroceramics
- Vol. 19 (1), 11-23
- https://doi.org/10.1007/s10832-007-9068-8
Abstract
No abstract availableKeywords
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