X-ray and electron microscopy studies of single-layer TaS2 and NbS2
- 1 March 1984
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 113 (2), 165-172
- https://doi.org/10.1016/0040-6090(84)90025-7
Abstract
No abstract availableKeywords
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