Mapping the local Young's modulus by analysis of the elastic deformations occurring in atomic force microscopy
- 1 January 1995
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 6 (1), 12-23
- https://doi.org/10.1088/0957-4484/6/1/003
Abstract
The atomic force microscope (AFM) is used to map the local elastic properties of substrates by analysis of the force versus tip motion curves. Measurements are presented, which show that gold islands on a rough polypropylene substrate can be distinguished from the surrounding polymer. Quantitative calculations of the elastic deformations of the tip and of the sample, as induced by the AFM, were performed. Surprisingly, the tip deformation is predominant over the sample deformation in a wide regime of forces and of tip radii; which are commonly used in AFM. This fact limits the capability of the AFM to measure local elastic properties. However, with our experimental set-up one can induce a total deformation dominated by the sample deformations.Keywords
This publication has 19 references indexed in Scilit:
- Energy dissipation during nanoscale indentation of polymers with an atomic force microscopeApplied Physics Letters, 1994
- Interpretation of force curves in force microscopyNanotechnology, 1993
- Measurement of Thin Film Mechanical Properties Using NanoindentationMRS Bulletin, 1992
- Interpretation issues in force microscopyJournal of Vacuum Science & Technology A, 1991
- Theory of elastic tip–surface interactions in atomic force microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Observation of metallic adhesion using the scanning tunneling microscopePhysical Review Letters, 1990
- Nanomechanics of a Au–Ir contact using a bidirectional atomic force microscopeJournal of Vacuum Science & Technology A, 1990
- Probing the surface forces of monolayer films with an atomic-force microscopePhysical Review Letters, 1990
- Atomic force microscopy for the study of tribology and adhesionThin Solid Films, 1989
- Atomic force microscopy of polymeric liquid filmsThe Journal of Chemical Physics, 1989