Surface analysis of polysiloxane/metal oxide interfaces
- 1 December 1977
- journal article
- research article
- Published by Springer Science and Business Media LLC in Journal of Materials Science
- Vol. 12 (12), 2511-2518
- https://doi.org/10.1007/bf00553938
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)Surface Science, 1975
- Durability of Adhesive JointsPublished by Springer Science and Business Media LLC ,1975
- Beam effects in AES revealed by XPSFaraday Discussions of the Chemical Society, 1975
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973
- Water at the InterfaceThe Journal of Adhesion, 1970