Interfacial Trap Density‐of‐States in Pentacene‐ and ZnO‐Based Thin‐Film Transistors Measured via Novel Photo‐excited Charge‐Collection Spectroscopy
- 3 August 2010
- journal article
- research article
- Published by Wiley in Advanced Materials
- Vol. 22 (30), 3260-3265
- https://doi.org/10.1002/adma.201000722
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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