Infrared optical properties of evaporated alumina films

Abstract
The dielectric function = 1 + i∊2 has been determined for Al2O3 films prepared by electron beam evaporation, in the 5–50-μm wavelength range. The data were extracted from spectrophotometric recordings of transmittance and reflectance by use of a novel technique. Supplementary measurements were made of the refractive index for visible and near-infrared wavelengths and of the dielectric constant at 1 MHz. Kramers-Kronig analysis was employed to check the consistency of our results for 1 and 2.