Measuring the critical thickness of thin metalorganic precursor films
- 1 June 1999
- journal article
- Published by Springer Science and Business Media LLC in Journal of Materials Research
- Vol. 14 (6), 2364-2368
- https://doi.org/10.1557/jmr.1999.0315
Abstract
Successful application of sol-gel, metalorganic decomposition, or hydrothermal routes to ceramic thin films depends on the mechanical integrity of the precursor film. Above a critical thickness, a precursor film will crack or decohere from the substrate during drying. The cracking and thickness of thin metalorganic precursor films were simultaneously observed during drying using a standard optical microscope. Isochromatic color fringes produced by interference of reflected white light were used to monitor film thickness. The critical film thickness was determined by the color fringe corresponding to the thickness at which propagating cracks terminated. As a demonstration of the technique, the critical thickness of titanium di(isopropoxide) bis(ethyl acetoacetate) films was measured, showing increased critical thickness with the addition of small amounts of an elastomeric polymer.Keywords
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