The modified Dempster-Shafer approach to classification
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans
- Vol. 27 (1), 96-104
- https://doi.org/10.1109/3468.553228
Abstract
This paper describes "modified Dempster-Shafer" (MDS), an approach to object identification which incorporates Bayesian prior distributions into an altered Dempster-Shafer rule of combination. The MDS combination rule reduces, under strong independence assumptions, to a special case of Bayes' rule. We show that MDS has rigorous probabilistic foundations in the theory of random sets. We also demonstrate close relationships between MDS and Smets' "pignistic" probabilities (1990), which in the MDS framework become true posterior distributions. We describe the application of MDS to a practical classification algorithm which uses an information-theoretic technique to limit the combinatorial explosion of evidence. We also define a non-ad hoc, MDS-based classification "miss distance" metric used to measure the performance of this algorithm.Keywords
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