Scaling analysis of phase-change memory technology
- 22 March 2004
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electronic switching effect in phase-change memory cellsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- OUM - A 180 nm nonvolatile memory cell element technology for stand alone and embedded applicationsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Reversible Electrical Switching Phenomena in Disordered StructuresPhysical Review Letters, 1968