Magnetic properties of Er2Fe14B and Nd2Fe14B thin films

Abstract

Thin films of Nd₂Fe₁₄B and Er₂Fe₁₄B have been synthesized by dc sputtering onto single‐crystal sapphire substrates. X‐ray diffraction revealed that the films were single phase and that the texture was sensitive to the substrate temperature. Films deposited onto substrates at 600 °C showed directed crystalline growth with the c axis of the tetragonal structure predominantly perpendicular to the film plane. Magnetization measurements of the Er₂Fe₁₄B films and Kerr rotation of the Nd₂Fe₁₄B films indicate an intrinsic anisotropy consistent with the preferred orientation. Electrical transport measurements of the Nd₂Fe₁₄B film display a change of slope near T=150 K which is interpreted as a consequence of the spin reorientation.