A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs
- 4 September 2007
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 47 (9-11), 1713-1718
- https://doi.org/10.1016/j.microrel.2007.07.035
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applicationsMicroelectronics Reliability, 2006
- Selected failure mechanisms of modern power modulesMicroelectronics Reliability, 2002