Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials
- 6 November 2002
- journal article
- Published by Elsevier BV in Journal of Crystal Growth
- Vol. 246 (3-4), 252-258
- https://doi.org/10.1016/s0022-0248(02)01749-9
Abstract
No abstract availableKeywords
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