Anomalous Lattice Vibrations of Single- and Few-Layer MoS2
Top Cited Papers
- 14 April 2010
- journal article
- research article
- Published by American Chemical Society (ACS) in ACS Nano
- Vol. 4 (5), 2695-2700
- https://doi.org/10.1021/nn1003937
Abstract
Molybdenum disulfide (MoS2) of single and few-layer thickness was exfoliated on SiO2/Si substrate and characterized by Raman spectroscopy. The number of S-Mo-S layers of the samples was independently determined by contact-mode atomic-force microscopy. Two Raman modes, E12g and A1g, exhibited sensitive thickness dependence, with the frequency of the former decreasing and that of the latter increasing with thickness. The results provide a convenient and reliable means for determining layer thickness with atomic-level precision. The opposite direction of the frequency shifts, which cannot be explained solely by van der Waals interlayer coupling, is attributed to Coulombic interactions and possible stacking-induced changes of the intralayer bonding. This work exemplifies the evolution of structural parameters in layered materials in changing from the 3-dimensional to the 2-dimensional regime.Comment: 14 pages, 4 figureKeywords
This publication has 32 references indexed in Scilit:
- Raman fingerprint of charged impurities in grapheneApplied Physics Letters, 2007
- The rise of grapheneNature Materials, 2007
- Breakdown of the adiabatic Born–Oppenheimer approximation in grapheneNature Materials, 2007
- Spatially Resolved Raman Spectroscopy of Single- and Few-Layer GrapheneNano Letters, 2007
- Raman Scattering from High-Frequency Phonons in Supported n-Graphene Layer FilmsNano Letters, 2006
- Two-dimensional atomic crystalsProceedings of the National Academy of Sciences of the United States of America, 2005
- Raman spectroscopy of graphitePhilosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 2004
- Exfoliated and Restacked MoS2 and WS2: Ionic or Neutral Species? Encapsulation and Ordering of Hard Electropositive CationsJournal of the American Chemical Society, 1999
- Characterization of nanometer scale wear and oxidation of transition metal dichalcogenide lubricants by atomic force microscopyApplied Physics Letters, 1991
- Lattice Mode Degeneracy in Moand Other Layer CompoundsPhysical Review Letters, 1970