Temperature effect on electrical characteristics of negative capacitance ferroelectric field-effect transistors

Abstract

The electrical properties of negative capacitance (NC) ferroelectric field-effect transistors (FeFETs) were theoretically investigated in the temperature range from 280 to 360 K. The derived results indicate that for a fixed thickness of ferroelectric thin film the amplification of surface potential can be tuned by temperature. The transfer and output characteristics degrade with increasing temperature due to the gradual loss of ferroelectric NC effect. It is expected that the derived results may provide some insight into the design and performance improvement for the low power dissipation applications of FeFETs.