Characterization of Titania Loaded V-, Fe-, and Cr-Incorporated MCM-41 by XRD, TPR, UV−vis, Raman, and XPS Techniques
- 8 March 2002
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 106 (13), 3394-3401
- https://doi.org/10.1021/jp0138983
Abstract
No abstract availableKeywords
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