A Josephson junction time domain reflectometer with room temperature access
- 1 March 1987
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 23 (2), 899-902
- https://doi.org/10.1109/tmag.1987.1064882
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- An all-niobium eight level process for small and medium scale applicationsIEEE Transactions on Magnetics, 1987
- A fast open-cycle cryocooler for cryogenic high-speed signal processing circuitsIEEE Transactions on Magnetics, 1987
- Model for a Josephson sampling gateJournal of Applied Physics, 1985
- Electronically adjustable delay for Josephson technologyIEEE Electron Device Letters, 1982
- A Josephson ultrahigh-resolution sampling systemApplied Physics Letters, 1980
- Generation and measurement of ultrashort current pulses with Josephson devicesApplied Physics Letters, 1980