Controlled barrier modification in Nb/NbOx/Ag metal insulator metal tunnel diodes
- 15 June 2002
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 91 (12), 10134-10139
- https://doi.org/10.1063/1.1471385
Abstract
The nonlinear electrical transport properties of metal-insulator-metal tunnel diodes based on a barrier of naturally grown niobium oxide have been measured at room temperature and analyzed. In most cases excellent agreement is found between the measured current-voltage characteristics and fits to the trapezoidal barrier model, over large ranges in conductance (up to several times the zero-bias value), and including the asymmetry induced by the differing electrode materials, niobium and silver. Moreover, we find that an in situ, Ar plasma etch may be used to modify the tunnel barrier in a controlled fashion. Specifically, as the etch time is increased from 0 to 120 s, the barrier thickness is continuously reduced from ∼2.8 to 1.1 nm, while the barrier height at the base (Nb) electrode remains roughly constant at Simultaneously, the barrier height at the Ag counterelectrode is lowered from an initial value of 800 mV to the asymptotic value implied by the difference in work functions of the electrode materials, namely,
Keywords
This publication has 27 references indexed in Scilit:
- Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer techniqueJournal of Applied Physics, 1999
- Optical frequency measurementsProceedings of the IEEE, 1986
- Potential barrier model incorporating localized states explaining tunnel anomaliesJournal of Applied Physics, 1985
- Point contact diode at laser frequenciesJournal of Applied Physics, 1985
- Polarity-dependent tunneling conductance of Ta/Ta2O5/Ag junctionsJournal of Applied Physics, 1980
- The MOM tunneling diode: Theoretical estimate of its performance at microwave and infrared frequenciesJournal of Applied Physics, 1978
- Tunneling Conductance of Asymmetrical BarriersJournal of Applied Physics, 1970
- Potential Barriers and Emission-Limited Current Flow Between Closely Spaced Parallel Metal ElectrodesJournal of Applied Physics, 1964
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963
- Low-Voltage Current-Voltage Relationship of Tunnel JunctionsJournal of Applied Physics, 1963