Characterizations of polycrystalline silicon nanowire thin-film transistors enhanced by metal-induced lateral crystallization
- 30 November 2012
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 77, 20-25
- https://doi.org/10.1016/j.sse.2012.05.025
Abstract
No abstract availableKeywords
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