Refractive Indices of Germanium, Silicon, and Fused Quartz in the Far Infrared
- 1 November 1967
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 6 (11), 1889-1895
- https://doi.org/10.1364/ao.6.001889
Abstract
For many years channel spectra, caused by multiple reflections of light between the faces of flat samples of optical material, have been used to determine refractive indices. Interferometers are excellent for this measurement, particularly in the far ir spectral region where their superior sensitivity and spectral resolution are required. The theory of the method is developed and the limitations are discussed. Experimentally determined refractive indices of silicon, germanium, and fused quartz are presented. These indices have been determined by these methods from data obtained with the Aerospace lamellar grating interferometer.Keywords
This publication has 9 references indexed in Scilit:
- On a Convergence Correction for Dispersive Fourier SpectrometryApplied Optics, 1967
- Measurement of the Optical Constants of Crystal Quartz in the Far Infrared with the Asymmetric Fourier-Transform Method*Journal of the Optical Society of America, 1967
- Pure Rotational Spectrum of Nitric OxideThe Journal of Chemical Physics, 1966
- A High-Resolution, Far Infrared Double-Beam Lamellar Grating InterferometerApplied Optics, 1966
- Measurement of the far infrared optical properties of solids with a Michelson interferometer used in the asymmetric mode: Part II, the vacuum interferometer∗Infrared Physics, 1966
- Measurement of the far infrared optical properties of solids with a michelson interferometer used in the asymmetric mode: Part I, mathematical formulation∗Infrared Physics, 1966
- Low-Temperature Far-Infrared Spectra of Germanium and SiliconPhysical Review B, 1964
- Far-Infrared Properties of Quartz and SapphireJournal of the Optical Society of America, 1962
- Optical Properties of Sapphire in the Far Infrared*Journal of the Optical Society of America, 1961