Determination of the nature of molecular bonding in silica from time-dependent dielectric breakdown data

Abstract

An effective molecular dipole moment of 7–13 e Å is routinely observed during time-dependent dielectric breakdown testing of silica-based dielectrics. A Mie-Grüneisen analysis of the molecular bonding states indicates that the upper end of the effective dipole moment range (13 e Å) is associated with a stretched silicon-oxygen bond while the lower end $\text{(7\hspace{0.17em}}\mathit{e}\mathrm{ \AA )}$ is consistent with a hole-captured silicon-oxygen bond.