On the Implementation of an Analog ATPG: The Linear Case

1 September 1985

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. IM-34 (3), 442-449
https://doi.org/10.1109/tim.1985.4315366

Abstract

A self-testing algorithm in which post-test simulation with failure bounds is employed, has been proposed. Based on this self-testing algorithm, an analog Automatic Test Program Generation (ATPG) for linear circuits or systems is being developed. The AATPG code is subdivided into off-line and on-line components while the actual test can be run in either a fully automatic mode or interactively.

Keywords

AUTOMATIC TEST PATTERN GENERATION
CIRCUIT TESTING
AUTOMATIC TESTING
BUILT-IN SELF-TEST
SYSTEM TESTING
COMPUTATIONAL MODELING
EQUATIONS
VECTORS
CIRCUIT SIMULATION
CIRCUIT FAULTS

This publication has 1 reference indexed in Scilit:

On the Connection Assignment Problem of Diagnosable Systems
IEEE Transactions on Electronic Computers, 1967

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