Static Proton and Heavy Ion Testing of the Xilinx Virtex-5 Device

Open Access

1 July 2007

conference paper
conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 177-184
https://doi.org/10.1109/redw.2007.4342561

Abstract

This paper presents proton and heavy ion static results for the latest Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiple-bit upsets (MBUs) and angular effects.

Keywords

PROTONS
FIELD PROGRAMMABLE GATE ARRAYS
AEROSPACE TESTING
CIRCUITS
RANDOM ACCESS MEMORY
DIGITAL SIGNAL PROCESSING
LABORATORIES
CYCLOTRONS
ROUTING
TABLE LOOKUP

This publication has 1 reference indexed in Scilit:

Radiation-induced multi-bit upsets in SRAM-based FPGAs
IEEE Transactions on Nuclear Science, 2005

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