Measurement of low-permittivity materials based on a spectral-domain analysis for the open-ended coaxial probe
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 42 (5), 879-886
- https://doi.org/10.1109/19.252521
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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