Thickness and temperature dependence of electrical properties of semiconducting (Bi0.75Sb0.25)2Te3 thin films
- 31 May 1998
- journal article
- Published by Elsevier BV in Solid State Communications
- Vol. 106 (5), 315-320
- https://doi.org/10.1016/s0038-1098(98)00002-7
Abstract
No abstract availableKeywords
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