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Testing for statistically significant differences between groups of scan patterns
Home
Publications
Testing for statistically significant differences between groups of scan patterns
Testing for statistically significant differences between groups of scan patterns
MF
Matt Feusner
Matt Feusner
Brian Lukoff
Brian Lukoff
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1 January 2008
conference paper
conference paper
Published by
Association for Computing Machinery (ACM)
p.
43-46
https://doi.org/10.1145/1344471.1344481
Abstract
No abstract available
Keywords
ANALYSIS
COMPARISON
EYE TRACKING
SCAN PATTERN
SCANPATH
SEQUENCE COMPARISON
SIMILARITY TEST
STATISTICS
Cited by 17 articles