Determination of Single-Bond Forces from Contact Force Variances in Atomic Force Microscopy
- 1 January 1996
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 12 (5), 1291-1295
- https://doi.org/10.1021/la950500j
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Chemical bonds studied with functionalized atomic force microscopy tipsAnalytica Chimica Acta, 1995
- Probing Adhesion Forces at the Molecular ScaleJournal of the American Chemical Society, 1995
- Effects of Discrete Protein-Surface Interactions in Scanning Force Microscopy Adhesion Force MeasurementsLangmuir, 1995
- Scanning Force Microscopies Can Image Patterned Self-Assembled MonolayersLangmuir, 1995
- Intermolecular Forces and Energies Between Ligands and ReceptorsScience, 1994
- Angle-Dependent X-ray Photoelectron Spectroscopy and Atomic Force Microscopy of Sulfur-Modified DNA on Au(111)The Journal of Physical Chemistry, 1994
- Friction effects on force measurements with an atomic force microscopeLangmuir, 1993
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Quantized adhesion detected with the atomic force microscopeJournal of the American Chemical Society, 1992
- Interpretation issues in force microscopyJournal of Vacuum Science & Technology A, 1991