In situX-ray topographic study of the dislocation mobility in high-purity and impurity-doped silicon crystals
- 1 April 1983
- journal article
- research article
- Published by Informa UK Limited in Philosophical Magazine A
- Vol. 47 (4), 599-621
- https://doi.org/10.1080/01418618308245248
Abstract
An in situ X-ray topographic technique using a high-power X-ray generator has been used to study the dislocation mobility at elevated temperatures in the stress range 1·2-40 MN m−2 for pure and impurity-doped silicon crystals. The variation of velocity with stress for both 60° and screw dislocations in high-purity crystal is linear throughout the whole stress range investigated, the activation energies for motion being independent of stress. No previously published theoretical models are able to account for the measured velocities quantitatively. Effects of impurities, such as oxygen, carbon, nitrogen, phosphorus and boron, are investigated in detail. Generally, the impurities bring about a deviation from linearity of the variation of velocity with stress under low stresses. Dislocations originally moving in impure crystals are immobilized when the stress becomes lower than a critical value. These phenomena are interpreted in terms of the development of an impurity atmosphere around slowly moving dislocations. Phosphorus atoms are known to enhance the dislocation motion under high stresses and to retard it under low stresses.Keywords
This publication has 29 references indexed in Scilit:
- Velocities of screw and 60° dislocations in n- and p-type siliconphysica status solidi (a), 1979
- A simple scheme for describing the motion of dislocations in siliconCrystal Research and Technology, 1978
- Investigation of the energy spectrum and kinetic phenomena in dislocated Si crystals (I)physica status solidi (a), 1977
- Velocities of Screw and 60°‐Dislocations in SiliconPhysica Status Solidi (b), 1972
- Effect of Impurities on the Individual Dislocation Mobility in SiliconPhysica Status Solidi (b), 1969
- Chemical Influence of Holes and Electrons on Dislocation Velocity in SemiconductorsPhysical Review Letters, 1967
- A CRITICAL REVIEW OF THE PEIERLS MECHANISMCanadian Journal of Physics, 1967
- Theory of Dislocation Mobility in SemiconductorsPhysical Review B, 1963
- Velocities and Densities of Dislocations in Germanium and Other Semiconductor CrystalsJournal of Applied Physics, 1962
- Distribution of solute atoms round a slow dislocationProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1949