Infrared vibrational spectra of rf-sputtered hydrogenated amorphous silicon

Abstract
We report the vibrational absorption spectra between 200 and 4000 cm1 of a series of amorphous sputtered Si1xHx alloys prepared under different conditions of substrate temperature, and hydrogen, oxygen, and argon partial pressures. The spectra show stretching and wagging vibrational modes of the Si-H bond, and bending modes attributable to Si-H2 configurations. Multiple features in the stretching vibrational spectrum are interpreted in terms of two different configurations of a single H atom. The integrated stretching vibrational absorption is correlated with the H content estimated from experiments on gas evolution upon heating. Finally, it is shown that different preparation conditions can lead to the same total H content but different vibrational spectra.