Differential surface photovoltage measurement of minority-carrier diffusion length in thin films
- 1 October 1985
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 47 (7), 740-742
- https://doi.org/10.1063/1.96023
Abstract
A new surface photovoltage technique is introduced for the determination of the minority-carrier diffusion length in thin semiconductor films. The technique eliminates the effect of a back surface barrier on the measurement by separating out the back barrier contribution to the total photovoltage signal. With a direct difference method based on a double lock-in technique, the measurement can be carried out in a single run.Keywords
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