Effect of surface roughness on surface resistance of plane copper surfaces at millimetre waves

1 January 1974

journal article
Published by Institution of Engineering and Technology (IET) in Proceedings of the Institution of Electrical Engineers

Vol. 121 (5), 333-336
https://doi.org/10.1049/piee.1974.0065

Abstract

Measurements have been made at 35 GHz of the increase of surface resistance of plane copper surfaces caused by surface roughness. The side walls of an H-guide cavity were ground one-directionally with abrasive papers of various grades. Surface roughness was determined mechanically, optically, and by microphotography. Q factors of the cavity were measured and evaluated and compared for various degrees of surface roughness

Keywords

MILLIMETRE WAVES
RESISTANCE MEASUREMENT
SURFACE ROUGHNESS
Q-FACTOR MEASUREMENT
SURFACE CONTOURS
CAVITY RESONATORS
MICROWAVE MEASUREMENT
PLANE COPPER SURFACES
SURFACE RESISTANCE

Cited by 5 articles