Radiation induced electrical and microstructural degradation at high temperature for HP SiC
- 31 October 2011
- journal article
- Published by Elsevier BV in Fusion Engineering and Design
- Vol. 86 (9-11), 2442-2445
- https://doi.org/10.1016/j.fusengdes.2010.12.064
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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