Progress in 3D Surface Microtopography Characterization
- 1 January 1996
- journal article
- Published by Elsevier BV in CIRP Annals
- Vol. 45 (2), 589-598
- https://doi.org/10.1016/s0007-8506(07)60513-7
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Investigation on the Surface Topography in Polishing Using Atomic Force MicroscopyCIRP Annals, 1996
- Roughness Parameters of Surfaces by Atomic Force MicroscopyCIRP Annals, 1995
- Advantages and Industrial Applications of Three-Dimensional Surface Roughness AnalysisCIRP Annals, 1994
- A method for concurrent engineering design of chaotic surface topographiesJournal of the American Academy of Dermatology, 1994
- Fractal analysis of topographic data by the patchwork methodWear, 1993
- Digital Filtering in Roughness MeasurementsPublished by Springer Science and Business Media LLC ,1993
- High Resolution Phase Measuring Laser Interferometric Microscope For Engineering Surface MetrologyPublished by SPIE-Intl Soc Optical Eng ,1988
- A digital system for surface roughness analysis of plane and cylindrical partsPrecision Engineering, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Tunneling through a controllable vacuum gapApplied Physics Letters, 1982