A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors
- 1 September 2002
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 42 (9-11), 1653-1658
- https://doi.org/10.1016/s0026-2714(02)00206-8