Thermal investigation of high power Optical Devices by transient testing
- 7 March 2005
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components and Packaging Technologies
- Vol. 28 (1), 45-50
- https://doi.org/10.1109/tcapt.2004.843197
Abstract
In case of opto-electronic devices, the power applied on the device leaves in a parallel heat and light transport, the interpretation of R/sub th/ is not obvious. The paper shows results of a combined optical and thermal measurement for the characterization of power light emitting diodes (LEDs). A model explaining R/sub th/ changes at different current levels is proposed.Keywords
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